Optical constants measurement of single-layer thin films on transparent substrates
- 15 December 1998
- journal article
- Published by Elsevier in Optics Communications
- Vol. 158 (1-6) , 221-230
- https://doi.org/10.1016/s0030-4018(98)00535-5
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- Optical constants of polycrystalline ZnSeCdSe alloy filmsOptical Materials, 1997
- Determination of the optical constants and thickness of thin films on slightly absorbing substratesApplied Optics, 1995
- Precision of Brewster-angle methods for optical thin filmsJournal of the Optical Society of America A, 1993
- Determination of (n,k) for absorbing thin films using reflectance measurementsApplied Optics, 1988
- Ellipsometry in Thin Film AnalysisAnnual Review of Materials Science, 1981
- Optical constants of absorbing materials by transmission interferometry on medium-thickness filmsJournal of the Optical Society of America, 1979
- Transmission method for determining the optical constants of metalsJournal of the Optical Society of America, 1973
- Multiple-Angle-of-Incidence Ellipsometry of Very Thin Films*Journal of the Optical Society of America, 1971
- Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*Journal of the Optical Society of America, 1964
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962