Intensity Anomaly of Fluorescent X-Ray Emission Accompanying the Laue Case Reflection from a Perfect Crystal
- 1 August 1967
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 23 (2) , 372-377
- https://doi.org/10.1143/jpsj.23.372
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Dependence of the Emission Yield of X-Rays from a Single Crystal on the Diffraction Condition of Exciting ElectronsJournal of the Physics Society Japan, 1967
- On the production of characteristic X-rays in thin metal crystalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1966
- Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompanying the Bragg Reflections from Perfect Si and Ge CrystalsJournal of the Physics Society Japan, 1966
- Temperature Dependence of X-Ray Absorption by Crystals 1. Photo-Electric AbsorptionJournal of the Physics Society Japan, 1964
- Effect of Dynamical Diffraction in X-Ray Fluorescence ScatteringPhysical Review B, 1964
- Anomalous absorption of slow neutrons and X-rays in nearly perfect single crystalsActa Crystallographica, 1956
- The reflexion and transmission of X-rays in perfect absorbing crystalsActa Crystallographica, 1952