Electrostrictive Tensor Components of PZT-Ceramics Measured by X-ray Diffraction
- 1 January 1985
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 24 (S2)
- https://doi.org/10.7567/jjaps.24s2.721
Abstract
The electrostrictive tensor components Q 11, Q 12 and Q 44 of Pb0.83Sr0.12Ba0.05 [Zr0.6Ti0.38Nb0.02]O3-ceramic were measured separately above Curie temperature with a time-resolved X-ray diffraction technique. The results were corrected for the influence of ceramic parameters. The corrected values are considered to be the same as single-crystal values. This was proven by comparison of values from measurements on BaTiO3-ceramics with the known values for BaTiO3 singlecrystals. The electrostrictive coefficients of the above mentioned ceramic were measured in a temperature range between 420K (Curie temperature) and 470K. The results were independent of temperature: Q 11=3.0·10-2 m4/C2, Q 12=-1.6·10-2 m4/C2 and Q 44=6.2·10-2 m4/C2. In the ceramic system Pb0.83Sr0.12Ba0.05[Zr x Ti0.98-x Nb0.02] O3 the electrostrictive coefficients were found to vary linearly with variation of x. Our measurements are compared with those of other authors.Keywords
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