Transient Voltage Measurement Techniques

Abstract
Transient voltages which occur in the circuits to protective relays and control devices have been known to wreck semiconductor components used in these circuits. Investigations have been conducted to determine the nature, cause, and magnitudes of these transient voltages. Obviously, the data obtained on these investigations should be as accurate as possible. Methods are presented which are used to improve the accuracy of recording with an oscilloscope in cases where the measuring equipment is beset with misleading indications.

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