An x-ray topographic study of defect structures in cyclotrimethylene trinitramine
- 16 December 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 8 (2) , 505-511
- https://doi.org/10.1002/pssa.2210080220
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- X-ray topographic study of dislocations in synthetic quartzPhysica Status Solidi (a), 1971
- Liquid inclusions in RDX crystalsJournal of Crystal Growth, 1970
- Dislocation etching of cyclotrimethylene trinitramine crystalsJournal of Crystal Growth, 1969
- Direct observation of dislocations in potash alumPhilosophical Magazine, 1969
- Some Recent Applications of X-Ray TopographyPublished by Springer Nature ,1967
- AN INVESTIGATION OF CRYSTAL IMPERFECTIONS BY X-RAY DIFFRACTION.Published by Defense Technical Information Center (DTIC) ,1966
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959