Structure analysis of chain‐folded lamellar polyamide crystals from X‐ray diffraction

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Abstract
Folded‐chain crystals of certain polyamides present some novel diffraction effects due to the small number of repeat units within the lamellar thickness. X‐ray diffraction evidence is available in the complete range from low to wide angles. This information is interpreted in terms of the structure factor of an individual lamella together with the lattice factor appropriate for the stacking of lamellae. When due account is taken of the lattice factor, whose effect can be detected even at large angles, three features of the lamellar structure can be deduced. First, the evidence is in favor of the straight‐chain stems traversing almost the total thickness of each lamella, implying sharp folds at the lamellar surfaces. Some consequences of this result on the interpretation of data obtained from annealed mats are mentioned. Second, the detailed determination of the stem structure demands that the majority of the folds in nylon 66 lie in the acid group. Third, there are regions of depleted electron density at the lamellar surfaces, though features of the crystal structure are still retained. This indicates the presence of some folds deeper in the crystal than the majority.

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