Depth-selective x-ray standing-wave analysis
- 15 October 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 30 (8) , 4881-4884
- https://doi.org/10.1103/physrevb.30.4881
Abstract
Energy-dispersive electron emission yields from silicon crystals were measured while Bragg reflecting 15-keV x rays from the (111) diffraction planes. By combining the characteristics of the excited x-ray standing-wave field with the electron-energy-loss process, it was possible to probe the structure for lattice perfection as a function of depth and to determine an energy-loss-dependent electron escape length.Keywords
This publication has 10 references indexed in Scilit:
- X-ray-standing-wave—modulated electron emission near absorption edges in centrosymmetric and noncentrosymmetric crystalsPhysical Review B, 1984
- A feedback control system for synchrotron radiation double crystal instrumentsNuclear Instruments and Methods in Physics Research, 1984
- Monte-Carlo calculations of keV electron and positron slowing down in solidsApplied Physics A, 1983
- X-Ray-Standing-Wave Atom Location in Heteropolar Crystals and the Problem of ExtinctionPhysical Review Letters, 1983
- A dynamic control and measuring system for synchrotron X-ray rocking curvesNuclear Instruments and Methods in Physics Research, 1983
- Solution to the Surface Registration Problem Using X-Ray Standing WavesPhysical Review Letters, 1982
- A new method of measuring electron emission from monocrystals under x-ray-diffraction conditionsPhysics Letters A, 1980
- Variation in the Yield of Photoelectrons Emitted from (111) and (\bar1\bar1\bar1) Surfaces of a Gallium Phosphide Crystal with the Diffraction Condition of X-RaysJournal of the Physics Society Japan, 1979
- Observation of internal x-ray wave fields during Bragg diffraction with an application to impurity lattice locationPhysical Review B, 1974
- Effect of Dynamical Diffraction in X-Ray Fluorescence ScatteringPhysical Review B, 1964