Chemically resolved electrical measurements using x-ray photoelectron spectroscopy
- 16 August 2004
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 85 (7) , 1271-1273
- https://doi.org/10.1063/1.1782261
Abstract
Noncontact chemically resolved electrical measurements are presented, capable of probing selected regions within fine heterostructures. Using a slightly modified x-ray photoelectron spectrometer, an effective means is demonstrated for measuring curves of molecular layers, free of substrate and contact contributions. The concept is simple and general, revealing unique details on electrical response mechanisms. Realized with commonly available equipment, it should be effective for a broad range of heterostructured systems.
Keywords
All Related Versions
This publication has 22 references indexed in Scilit:
- Sequence-Specific Molecular Lithography on Single DNA MoleculesScience, 2002
- ELECTRONTRANSMISSIONTHROUGHMOLECULES ANDMOLECULARINTERFACESAnnual Review of Physical Chemistry, 2001
- Conductance Switching in Single Molecules Through Conformational ChangesScience, 2001
- Temperature Effects on the Transport Properties of MoleculesPhysical Review Letters, 2001
- Mechanisms of charging in electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1999
- Surface photovoltage phenomena: theory, experiment, and applicationsSurface Science Reports, 1999
- Electron Transfer at Electrodes through Conjugated “Molecular Wire” BridgesJournal of the American Chemical Society, 1999
- Composite interface analysis using voltage contrast XPSSurface and Interface Analysis, 1993
- Studies in differential chargingJournal of Vacuum Science & Technology A, 1989
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988