Transmission electron microscopy of transverse sections through oxide scales on metals
- 1 August 1982
- journal article
- Published by Springer Nature in Oxidation of Metals
- Vol. 18 (1) , 27-40
- https://doi.org/10.1007/bf00656093
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Advances in Transmission Electron Microscope Techniques Applied to Device Failure AnalysisJournal of the Electrochemical Society, 1980
- Method of Preparing TEM Foils from thick Oxides and Metal/Oxide InterfacesBritish Corrosion Journal, 1980
- Method for the cross‐sectional examination of molecular semiconductor/metal film junctions using transmission electron microscopyJournal of Vacuum Science and Technology, 1978
- Thin film transmission electron microscopy of sulphuric acid anodized films by direct vertical sectioningCorrosion Science, 1977