A simple device for the preparation of embedded materials science specimens for ultramicrotomy
- 1 July 1987
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 6 (3) , 305-306
- https://doi.org/10.1002/jemt.1060060304
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Cometary Particles: Thin Sectioning and Electron Beam AnalysisScience, 1986
- An improved method for thin sectioning of particulate catalystsJournal of Electron Microscopy Technique, 1985