The effect of rise time and field gradient on nonlinear bit shift in thin film heads
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 30 (6) , 3879-3881
- https://doi.org/10.1109/20.333931
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Nonlinear intersymbol destruction versus linear intersymbol interference on high density disk drivesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Dynamic field distributions of thin film inductive headsIEEE Transactions on Magnetics, 1992
- Implementation of PRML in a rigid disk driveIEEE Transactions on Magnetics, 1991
- An experimental 180 Mb/sec PRML channel for magnetic recordingIEEE Transactions on Magnetics, 1991
- A technique for measuring nonlinear bit shiftIEEE Transactions on Magnetics, 1991
- Three-dimensional transmission line model for flux conduction in thin-film recording headsJournal of Applied Physics, 1990
- Gigabit density recording using dual-element MR/inductive heads on thin-film disksIEEE Transactions on Magnetics, 1990
- Frequency response of thin film heads with longitudinal and transverse anisotropyIEEE Transactions on Magnetics, 1990
- A self-consistent model for overwrite modulation in thin film recording mediaIEEE Transactions on Magnetics, 1988
- The effect of finite flux rise time on recording performanceIEEE Transactions on Magnetics, 1970