Scanning tunneling microscopy and spectroscopy on 7 × 7 reconstructed Si(111) surfaces containing defects
- 31 January 1988
- journal article
- Published by Elsevier in Surface Science
- Vol. 193 (1-2) , 235-258
- https://doi.org/10.1016/0039-6028(88)90334-2
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
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