An Algorithm for Selecting an Optimum Set of Diagnostic Tests

1 October 1965

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electronic Computers

Vol. EC-14 (5) , 706-711
https://doi.org/10.1109/pgec.1965.264210

Abstract

In the design of combinational diagnostic testing procedure for a large digital system, some redundant tests are expected. This paper describes an algorithm for selecting a good (locally optimized) set of diagnostic tests which contains no redundancy. The algorithm will in general tend to give a ``fairly good'' set of test patterns, but is not guaranteed to be absolutely minimal. An overall optimization scheme is desirable but seems impractical [1]. The procedure described can be used either to yield a set of diagnostics which loses no resolution from the full set, or to yield a smaller set with some loss in resolution.

Keywords

This publication has 4 references indexed in Scilit:

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IEEE Transactions on Electronic Computers, 1964
No. 1 ESS Maintenance Plan
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