Simple modeling techniques for analysis of laser beam induced current images
- 1 March 1990
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 8 (2) , 1127-1132
- https://doi.org/10.1116/1.576973
Abstract
Spatially resolved laser beam induced current measurements yield large volumes of data. We present here a data reduction technique based on simple emulation of the laser beam induced current (LBIC) response expected from a distribution of charge in a medium. A model for the current expected when scanning over a buried charged sheet allows some LBIC data to be reduced to a geometric model for a cracked sample. The results obtained are sufficiently encouraging to indicate that such modeling methods can reduce the often complex LBIC images obtained from HgCdTe material to a digest of geometric and electrical properties.Keywords
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