Convergent-beam electron diffraction from GaAs/AlAs superlattices
- 31 December 1987
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 21 (4) , 389-392
- https://doi.org/10.1016/0304-3991(87)90038-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Some aspects of the X-ray structural characterization of (Ga1−xAlxAs)n1(GaAs)n2/GaAs(001) superlatticesJournal of Applied Crystallography, 1984
- The symmetry of electron diffraction zone axis patternsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1976