Mapping induction distributions by transmission electron microscopy (invited)
- 15 April 1991
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 69 (8) , 6078-6083
- https://doi.org/10.1063/1.347775
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Micromagnetics of Co-based media: Experiment and model (invited)Journal of Applied Physics, 1990
- High resolution imaging of magnetic structures in the transmission electron microscopeMaterials Science and Engineering: B, 1989
- Implementation of differential phase contrast Lorentz microscopy on a conventional transmission electron microscopeJournal of Applied Physics, 1988
- Antiferromagnetism in YBa2Cu3O6+x (invited)Journal of Applied Physics, 1988
- Magnetic structure determination in small regularly shaped particle using transmission electron microscopyIEEE Transactions on Magnetics, 1988
- Determination of domain wall structures in thin foils of soft magnetic alloyJournal of Magnetism and Magnetic Materials, 1985
- The investigation of magnetic domain structures in thin foils by electron microscopyJournal of Physics D: Applied Physics, 1984
- Magnetic-Field-Free Objective Lens around a Specimen for Observing Fine Structure of Ferromagnetic Materials in a Transmission Electron MicroscopeJapanese Journal of Applied Physics, 1983