A transmission electron microscopy study of cristobalite
- 1 June 1989
- journal article
- Published by Taylor & Francis in Phase Transitions
- Vol. 16 (1-4) , 41-45
- https://doi.org/10.1080/01411598908245678
Abstract
The results of a transmission electron microscope (TEM) study of both the high- and low-forms of cristobalite as well as of the phase transition between them are presented. Both high- and low-forms are found to exhibit intense, closely related diffuse intensity distributions. The microstructure of the α-(or low-) form includes both tetragonal twin variants as well as a characteristic array of striations corresponding to planar boundaries. Satellite dark field imaging rules out the possibility that these are simple displacement faults.Keywords
This publication has 1 reference indexed in Scilit:
- An electron diffraction and lattice-dynamical study of the diffuse scattering in β-cristobalite, SiO2Journal of Applied Crystallography, 1988