A noise detection scheme with 10 mK noise temperature resolution for semiconductor single electron tunneling devices
- 1 June 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 81 (11) , 7350-7356
- https://doi.org/10.1063/1.365332
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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