Preparation of ZrO2 on flat, conducting SiO2/Si(100) model supports by wet chemical techniques; X-ray photoelectron spectroscopy and Auger depth profiling
- 1 May 1991
- journal article
- research article
- Published by Springer Nature in Catalysis Letters
- Vol. 10 (3-4) , 201-209
- https://doi.org/10.1007/bf00772072
Abstract
No abstract availableKeywords
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