Anisotropy in the resistivity of thin aluminium films

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Abstract
The electrical resistivity of 14 specimens of aluminium single crystal films has been measured in the temperature region between 2°K and 15°K. The specimens were prepared in groups of equal thickness, and it was found that the resistivity depends on the crystal orientation. This size-dependent anisotropy is explained by a simple model which treats the electrons near the zone boundaries as ineffective, and the agreement between the theoretical predictions and the experimental results is good.