Voltage contrast XPS—a novel scheme for spatially resolved XPS studies
- 1 March 1987
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 10 (2-3) , 149-152
- https://doi.org/10.1002/sia.740100215
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Auger microscopy using sample modulationReview of Scientific Instruments, 1984
- Characterization of VLSI materialsJournal of Vacuum Science & Technology A, 1983
- X‐ray photoelectron and Auger analysis of thin filmsJournal of Vacuum Science and Technology, 1981
- Synchrotron Radiation ResearchPublished by Springer Nature ,1980
- SURFACE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPYPublished by Elsevier ,1975
- LIII. The Examination of p-n Junctions with the Scanning Electron Microscope†Journal of Electronics and Control, 1957
- Chemical Reactions in Barium Oxide on Tungsten EmittersJournal of Applied Physics, 1952