Volume increase phenomena in reciprocal scratching of polycarbonate studied by atomic force microscopy
- 1 September 1995
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 13 (5) , 1938-1944
- https://doi.org/10.1116/1.588112
Abstract
An atomic force microscope(AFM) was used to study the microwear process of polycarbonate (PC).Testing included line scratching of the polymer surface using a microfabricated Si3N4AFM tip of 10–20 nm radius. Interfacial adhesion,friction, the effect of the number of scratches, and scanning speed were studied. Unlike previous reports, projections as a result of polycarbonate apparent volume increase have been observed after reciprocal scratching on the same track (without an AFM tip lateral feed). In spite of analytically predicted elastic/plastic contact, no plastic deformation was found during the tests. A model, based on the formation of cracks and their growth was suggested to explain these phenomena. No viscoelastic/plastic behavior (scanning speed effect on friction or microwear) was found.Keywords
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