A diagnostic study of the field emission characteristics of individual micro-emitters in CVD diamond films

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Abstract
Details are given of an experimental study of the characteristics of field-induced electron emission from 15 mm diameter CVD diamond films deposited on an Mo substrate. Three dedicated techniques have been used to characterize the electron emission process: (i) the 'transparent anode imaging' technique for recording the spatial distributions of emission sites and the total current-voltage (I-V) characteristic, (ii) the 'anode probe hole' technique for measuring the I-V characteristic of individual sites, and (iii) 'field emission electron spectroscopy' for studying the energy distribution of emitted electrons. Finally, the physical implications of the findings from the electron energy spectroscopy measurement are discussed.