Use of external beam in PIXE
- 1 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2) , 45-47
- https://doi.org/10.1016/0029-554x(77)90805-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Analyse sous helium par la technique de fluorescence X induite par protonsNuclear Instruments and Methods, 1975
- Preparation of thin film deposits from biological, environmental and other matterNuclear Instruments and Methods, 1971