Recent results and future challenges for the NIST charged-capacitor experiment
Open Access
- 1 April 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 46 (2) , 294-298
- https://doi.org/10.1109/19.571835
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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