Crack formation in epitaxial [110] thin films of YBa2Cu3O7−δ and PrBa2Cu3O7−x on [110]SrTiO3 substrates

15 April 1991

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 58 (15) , 1682-1684
https://doi.org/10.1063/1.105110

Abstract

A characteristic feature of epitaxial [110] thin films of YBa₂Cu₃O_7−δ and PrBa₂Cu₃O_7−x on [110]SrTiO₃ substrates is that the films have a tendency to crack along the (001) planes. We have studied the crack spacing as a function of deposition temperature and film thickness. The experimental data have been found to be in excellent agreement with a theoretical analysis of the crack spacings in brittle films. The study has allowed us to determine the critical thickness below which no cracks are expected to form as a function of temperature for [110] films of YBa₂Cu₃O_7−δ, PrBa₂Cu₃O_7−x, and YBa₂Cu₃O_7−δ/ PrBa₂Cu₃O_7−x bilayers.

Keywords

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