Eigenvalue analysis of the surface forces apparatus interferometer
- 1 July 1995
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 12 (7) , 1593-1601
- https://doi.org/10.1364/josaa.12.001593
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- The X-Ray Surface Forces Apparatus: Structure of a Thin Smectic Liquid Crystal Film Under ConfinementScience, 1994
- Analytic solution for the three-layer multiple beam interferometerApplied Optics, 1991
- Adhesion and short-range forces between surfaces. Part II: Effects of surface lattice mismatchJournal of Materials Research, 1990
- Multiple-beam interferometry with thin metal films and unsymmetrical systemsJournal of Physics D: Applied Physics, 1989
- Molecular Tribometry of Ultrathin Liquid FilmsPhysical Review Letters, 1988
- Forces due to structure in a thin liquid crystal filmJournal de Physique, 1981
- Measurement of forces between two mica surfaces in aqueous electrolyte solutions in the range 0–100 nmJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1978
- Thin film studies using multiple-beam interferometryJournal of Colloid and Interface Science, 1973
- The measurement of van der Waals dispersion forces in the range 1.5 to 130 nmProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1972
- The direct measurement of normal and retarded van der Waals forcesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1969