Miller and noise effects in a synchronizing flip-flop
- 1 June 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 34 (6) , 849-855
- https://doi.org/10.1109/4.766819
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A fast resolving BiNMOS synchronizer for parallel processor interconnectIEEE Journal of Solid-State Circuits, 1995
- Metastability of CMOS latch/flip-flopIEEE Journal of Solid-State Circuits, 1990
- Synchronization reliability in CMOS technologyIEEE Journal of Solid-State Circuits, 1985