Transient-fault analysis for retry techniques
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 37 (3) , 323-330
- https://doi.org/10.1109/24.3763
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Model for Transient and Permanent Error-Detection and Fault-Isolation CoverageIBM Journal of Research and Development, 1982
- Cosmic Ray Induced in MOS Memory CellsIEEE Transactions on Nuclear Science, 1978
- An Approach to the Diagnosis of Intermittent FaultsIEEE Transactions on Computers, 1975
- Intermittent Faults: A Model and a Detection ProcedureIEEE Transactions on Computers, 1974