Copper deep acceptors in GaAs1-xPxalloy system
- 20 February 1985
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 18 (5) , 1017-1024
- https://doi.org/10.1088/0022-3719/18/5/009
Abstract
Results on the optical characterisation of copper deep acceptors throughout the alloy composition range (01-xPx are reported. A comparison of the hole photoionisation spectra for different compositions, measured by the transient photocapacitance technique, reveals a broadening effect near the threshold which is interpreted in terms of random alloy effects on the deep level. An approximately linear variation of the hole photoionisation threshold with composition is found.Keywords
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