Systematic inquiry in tests of negative/positive replica combinations for SEM
- 1 February 1985
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 137 (2) , 209-216
- https://doi.org/10.1111/j.1365-2818.1985.tb02578.x
Abstract
High resolution replica materials are routinely used in scanning electron microscopy. A systematic evaluating procedure for replica combinations is proposed which details fourteen points to be recorded. These points include quantitative and qualitative information useful when assessing a replica combination for a particular research problem. A case study employing one silicone-based impression material and one epoxy resin is performed as an example of the procedure.Keywords
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