Scanning tunneling microscopy of III-V compound semiconductor (001) surfaces

• 1 October 1997
• journal article
• Published by Elsevier in Progress in Surface Science
• Vol. 56  (1) , 1-131
• https://doi.org/10.1016/s0079-6816(97)00033-6

Abstract

Keywords

• AES
• AUGER ELECTRON SPECTROSCOPY
• AFM
• ATOMIC FORCE MICROSCOPY
• ECM
• ELECTRON COUNTING MODEL
• HOMO
• HIGHEST OCCUPIED MOLECULAR ORBITAL
• HREELS
• HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY
• IBA
• ION BOMBARDMENT AND ANNEALING
• LEED
• LOW ENERGY ELECTRON DIFFRACTION
• LUMO
• LOWEST UNOCCUPIED MOLECULAR ORBITAL
• MBE
• MOLECULAR BEAM EPITAXY
• MEE
• MIGRATION ENHANCE EPITAXY