Reference plane orientation using optoelectronic methods in Moire contour lining
- 31 October 1976
- journal article
- Published by Elsevier in Optics Communications
- Vol. 19 (1) , 37-41
- https://doi.org/10.1016/0030-4018(76)90379-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Sandwich hologram interferometry 3:ContouringApplied Optics, 1976
- Characterization and control of threedimensional objects using fringe projection techniquesNouvelle Revue d'Optique, 1975
- Une ‘méthode des franges’ en temps réel et ses applications industrielles: déformations, vibrations, courbes de niveauOptical and Quantum Electronics, 1975
- Moiré TopographyApplied Optics, 1970