Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering
- 1 November 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (11) , L829
- https://doi.org/10.1143/jjap.20.l829
Abstract
A new technique for analyzing the quantitative surface atomic geometry and the two-dimensional surface electron distribution is reported. The remarkable effectiveness of this new technique is demonstrated for TiC(111).Keywords
This publication has 10 references indexed in Scilit:
- Electronic properties of the clean and hydrogen-covered TiC(111) Ti-terminated polar surfaceSolid State Communications, 1981
- Chemisorption geometry ofoxygen on Cu (001) from angle-resolved core-level x-ray photoemissionPhysical Review B, 1980
- Angle-resolved photoemission studies of TiC(111) and TiC(100)Physical Review B, 1980
- Geometrical and electronic structure of Si(001) and Si(111) surfaces: A status reportJournal of Vacuum Science and Technology, 1980
- Catalytic activities of TiC, WC, and TaC for hydrogenation of ethyleneJournal of Catalysis, 1979
- Oxygen adsorption on Cu(
- Temperature dependence of Pt(111) surface relaxationSurface Science, 1978
- Sputtering yields of graphite and carbides and their potential use as first wall materialsJournal of Nuclear Materials, 1978
- Possibility of adsorbate position determination using final-state interference effectsPhysical Review B, 1976
- Surface analysis with low energy ion scatteringApplied Physics A, 1976