Simple Measurement of the Reflectivity of Antireflection-Coated Laser Diode Facets
- 1 June 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (6A) , L1128
- https://doi.org/10.1143/jjap.27.l1128
Abstract
A laser diode facet reflectivity measuring method which uses the threshold current ratio of an antireflection coated to an uncoated laser is proposed. The method's measuring characteristics are determined and compared with those of conventional methods. The proposed method is simpler, easier and more accurate than conventional methods, such as the two-facet power ratio method and the spectrum modulation index method even for low facet reflectivities.Keywords
This publication has 3 references indexed in Scilit:
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- Measurement of the modal reflectivity of an antireflection coating on a superluminescent diodeIEEE Journal of Quantum Electronics, 1983
- CONTROL OF FACET DAMAGE IN GaAs LASER DIODESApplied Physics Letters, 1971