Dosimetry at interfaces. Theoretical analysis and measurements by means of thermoluminescent LiF at plane interfaces between a low Z-material and Al, Cu, Sn or Pb irradiated with 100 to 200 kV roentgen radiation.

  • 1 January 1973
    • journal article
    • Vol. 332, 1-64
Abstract
No abstract available

This publication has 0 references indexed in Scilit: