Quantitative surface measurements of metal oxide powders by X-ray photoelectron spectroscopy (XPS)
- 1 February 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 71 (2) , 231-246
- https://doi.org/10.1016/0039-6028(78)90330-8
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- X-ray photoionization cross sections for quantitative analysisSurface Science, 1976
- Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eVJournal of Electron Spectroscopy and Related Phenomena, 1976
- General formalism for quantitative Auger analysisSurface Science, 1975
- Relative photoelectron signal intensities obtained with a magnesium x-ray sourceAnalytical Chemistry, 1975
- A combined ESCA and Auger spectrometerJournal of Vacuum Science and Technology, 1975
- Experimental evaluation of a simple model for quantitative analysis in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Theoretical study of atomic subshell cross sections in x-ray phototelectron spectraChemical Physics Letters, 1974
- Relative intensities in x-ray photoelectron spectraJournal of Electron Spectroscopy and Related Phenomena, 1973
- Quantitative Auger electron spectroscopy and electron rangesSurface Science, 1972
- Sensitivity of detection of the elements by photoelectron spectrometryAnalytical Chemistry, 1972