Angle‐Resolved X‐Ray Photoelectron Spectroscopy Study for Reactive‐Sputter‐Etched GaAs Surface
- 1 September 1985
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 132 (9) , 2224-2227
- https://doi.org/10.1149/1.2114324
Abstract
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