Characteristics of Natural, Swept Natural, and Cultured X- and Z-Growth Quartz Material in High Temperature, High Stress Applications
- 1 January 1985
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 223-229
- https://doi.org/10.1109/freq.1985.200848
Abstract
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This publication has 1 reference indexed in Scilit:
- A New, Surface Recording, Down-Hole Pressure GaugePublished by Society of Petroleum Engineers (SPE) ,1972