Characterization of GGG-substrate surfaces by X-ray topography and etching
- 16 November 1975
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 32 (1) , K17-K18
- https://doi.org/10.1002/pssa.2210320146
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Dislocations in gadolinium gallium garnet (Gd3Ga5O12)—I. Dislocations at inclusionsActa Metallurgica, 1973
- Zum Nachweis von Orientierungszusammenhängen makroskopischer Substrukturen durch Drahtschattenabbildung mittels Berg‐Barrett‐TechnikCrystal Research and Technology, 1967
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959