RBS analysis of AlxGa1−xAs layers using 30 MeV 16O ions
- 1 June 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 4 (1) , 88-91
- https://doi.org/10.1016/0168-583x(84)90046-6
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Electron probe microanalysis of epitaxial garnet filmsJournal of Crystal Growth, 1981