X-ray fluorescence analysis in the ng region using total reflection of the primary beam
- 31 December 1980
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 35 (10) , 607-614
- https://doi.org/10.1016/0584-8547(80)80036-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Background subtract subroutine for spectral dataAnalytical Chemistry, 1978
- Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amountsAnalytical Chemistry, 1975
- The Si(Li) X‐Ray energy analysis system: Operating principle and performanceX-Ray Spectrometry, 1972