A review of fault models for lsi/vlsi devices
- 1 January 1983
- journal article
- review article
- Published by Institution of Engineering and Technology (IET) in Software & Microsystems
- Vol. 2 (2) , 44
- https://doi.org/10.1049/sm.1983.0016
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976