An X-ray topographic study of planar growth defects in a natural diamond
- 1 July 1965
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 12 (115) , 177-189
- https://doi.org/10.1080/14786436508224958
Abstract
Ten outcropping planar defects 30 to 70 μm in edge length lying in {111} planes inclined to the octahedral faces of an unusually perfect diamond (diameter 4 mm) were revealed by diffraction contrast but could not be detected optically. Those defects in the form of an equilateral triangle with one edge in the crystal surface show stacking-fault-type fringes and are bounded by Frank sessile dislocations. A single regular tetrahedral fault surface lying wholly within the crystal produces a type of x-ray interference not previously observed. Its diffraction theory is outlined, and computed fringe positions and spacings agree well with observation.Keywords
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