A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology
- 1 October 1988
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 21 (5) , 543-549
- https://doi.org/10.1107/s0021889888006624
Abstract
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