Topochemical characterization of materials using 3D-SIMS
- 1 January 1993
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 346 (1) , 66-68
- https://doi.org/10.1007/bf00321384
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Three dimensional ultra trace analysis of materialsMicrochimica Acta, 1992
- Acquisition and quantification of ion images with a camera-based detection system and classical quantification algorithmsJournal of the American Society for Mass Spectrometry, 1990
- Classical analysis including trace-matrix separation versus solid state mass spectrometry: A comparative study for the analysis of high purity Mo, W and CrMicrochimica Acta, 1990
- A microcomputer based digital imaging system for ion microanalysisJournal of Microscopy, 1985