Electron differential inverse mean free path for surface electron spectroscopy
- 20 August 1996
- journal article
- research article
- Published by Elsevier in Surface Science
- Vol. 364 (2) , 131-140
- https://doi.org/10.1016/0039-6028(96)00616-4
Abstract
No abstract availableKeywords
This publication has 41 references indexed in Scilit:
- Monte Carlo analysis of XPS and REELS spectra obtained at different take‐off anglesSurface and Interface Analysis, 1992
- Electron inelastic mean free paths versus attenuation lengths in solidsJournal of Physics D: Applied Physics, 1992
- Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and PdPhysical Review B, 1991
- Surface analysis: x-ray photoelectron spectroscopy and Auger electron spectroscopyAnalytical Chemistry, 1988
- Elastic and inelastic scattering of electrons reflected from solids: Effects on energy spectraPhysical Review B, 1985
- Self-energy of a fast-moving charge near a surfaceJournal of Physics C: Solid State Physics, 1979
- Finite-energy-sum rules for valence electronsPhysical Review B, 1978
- Microscopic calculation of surface-plasmon dispersion and dampingPhysical Review B, 1974
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972
- Plasma Losses by Fast Electrons in Thin FilmsPhysical Review B, 1957