Interpreting face images using active appearance models
- 1 January 1998
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 300-305
- https://doi.org/10.1109/afgr.1998.670965
Abstract
We demonstrate a fast, robust method of interpreting face images using an Active Appearance Model (AAM). An AAM contains a statistical model of shape and grey level appearance which can generalise to almost any face. Matching to an image involves finding model parameters which minimise the difference between the image and a synthesised face. We observe that displacing each model parameter from the correct value induces a particular pattern in the residuals. In a training phase, the AAM learns a linear model of the correlation between parameter displacements and the induced residuals. During search it measures the residuals and uses this model to correct the current parameters, leading to a better fit. A good overall match is obtained in a few iterations, even from poor starting estimates. We describe the technique in detail and show it matching to new face images.Keywords
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