The Spherical Drift Chamber for X-Ray Imaging Applications
- 1 January 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 22 (1) , 269-271
- https://doi.org/10.1109/tns.1975.4327649
Abstract
Properties of proportional chambers with spherical drift spaces have been investigated. An experiment of X-ray diffraction in crystals shows that an accuracy of 0.5 mm, at 20° inclination with respect to the axis of the chamber, can be obtained with 4 cm of drift length. Such chambers have many applications: X-ray diffraction patterns, pin-hole imaging, angular distributions of cascades of X-rays in nuclear physics, etc.Keywords
This publication has 3 references indexed in Scilit:
- The spherical drift chamber for x-ray imaging applicationsNuclear Instruments and Methods, 1974
- Localisation de particules par computeur à migrationNuclear Instruments and Methods, 1973
- Some developments in the operation of multiwire proportional chambersNuclear Instruments and Methods, 1970