Shmoo plotting: the black art of IC testing
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 14 (3) , 90-97
- https://doi.org/10.1109/54.606005
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- VLSI Yield Prediction and Estimation: A Unified FrameworkIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986